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Thin films of Ni and Co have been investigated by Brillouin Light Scattering (BLS). The samples, grown by evaporation (Ni) and RF sputtering (Co) on silicon substrates, have thicknesses in the range 16–98 nm. The Damon-Eshbach surface mode and several bulk standing waves have been detected. A macroscopic approach has been adopted in order to calculate the dispersion relations of the spin waves. The method takes into account the dipolar and exchange interactions, together with bulk and surface magnetic anisotropies. The spin waves frequencies and the scattering cross section have been calculated by using the bulk and surface anisotropies as relevant fitting parameters.
Magnetic Fe/Ni multilayers, investigated by Magnetic Force Microscopy (MFM), show a stripe domains structure in which the magnetization is oriented in the film plane. This structure is attributed to the equilibrium configuration between competing in-plane anisotropy of the Ni layers and perpendicular anisotropy due to the thin Fe layers.
We have used Brillouin scattering to study the dependence of the elastic constants of uniaxial polymeric Langmuir-Blodgett thin films on the thickness of the polymeric molecule monolayers. With increasing monolayer thickness, an overall decrease in the elastic constants and an increase in the refractive index n33 was observed.
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