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Crystal chemistry, X-ray diffraction reference patterns, and bandgap studies for (BaxSr1-x)2CoWO6 (x = 0.1, 0.2, 0.3, 0.5, 0.7, and 0.9) - CORRIGENDUM
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- Powder Diffraction / Volume 36 / Issue 3 / September 2021
- Published online by Cambridge University Press:
- 12 April 2021, p. 217
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Crystal chemistry, X-ray diffraction reference patterns, and bandgap studies for (BaxSr1–x)2CoWO6 (x = 0.1, 0.2, 0.3, 0.5, 0.7, and 0.9)
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- Powder Diffraction / Volume 35 / Issue 3 / September 2020
- Published online by Cambridge University Press:
- 23 June 2020, pp. 197-205
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Structural and optical properties of Ba3(Nb6−xTax)Si4O26 (x = 0.6, 1.8, 3.0, 4.2, 5.4)
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- Powder Diffraction / Volume 34 / Issue 4 / December 2019
- Published online by Cambridge University Press:
- 23 September 2019, pp. 331-338
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Structural and optical properties of Ba(Co1−xZnx)SiO4 (x = 0.2, 0.4, 0.6, 0.8)
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- Powder Diffraction / Volume 34 / Issue 3 / September 2019
- Published online by Cambridge University Press:
- 20 June 2019, pp. 242-250
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D-91 Characterizing X-ray Mirrors in Reciprocal Space: Results from the NIST X-ray Optics Evaluation Double-Crystal Diffractometer
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- Powder Diffraction / Volume 24 / Issue 2 / June 2009
- Published online by Cambridge University Press:
- 20 May 2016, p. 165
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D-112 Quantitative Evaluation of Graded Parabolic Multilayer Optics—Invited
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- Powder Diffraction / Volume 19 / Issue 2 / June 2004
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- 20 May 2016, p. 201
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D-57 NIST SRM 2000—A High Resolution X-ray Diffraction Standard Reference Material
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- Powder Diffraction / Volume 24 / Issue 2 / June 2009
- Published online by Cambridge University Press:
- 20 May 2016, p. 171
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X-Ray Reflectometry Determination of Structural Information from Atomic Layer Deposition Nanometer-scale Hafnium Oxide Thin Films
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- MRS Online Proceedings Library Archive / Volume 996 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 0996-H07-05
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- 2007
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Real-Time XRD Characterization of Growth of Sputtered Tantalum Films
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- MRS Online Proceedings Library Archive / Volume 840 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, Q3.7
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- 2004
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Grazing Incidence Small Angle X-Ray Scattering Study on Low Dielectric Thin Films
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- MRS Online Proceedings Library Archive / Volume 612 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, D5.23.1
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- 2000
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