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Integration of nanocrystal quantum dots with crystalline semiconductor substrates: Structure, Stability, and Optical response
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- Journal:
- MRS Online Proceedings Library Archive / Volume 854 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, U4.7
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- 2004
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Optical and Structural Characterization of Nanocrystalline Silicon Superlattices: Toward Nanoscale Silicon Metrology
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- Journal:
- MRS Online Proceedings Library Archive / Volume 638 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, F5.1.1
- Print publication:
- 2000
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Two-dimensional carrier profiling of advanced sub-micron silicon devices using Scanning Capacitance Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 960-961
- Print publication:
- August 1999
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Effect of surface oxide characteristics on Scanning Capacitance Microscopy Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 978-979
- Print publication:
- August 1999
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Dielectric Function of AlN Grown on Si (111) by MBE
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- Journal:
- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 231
- Print publication:
- 1999
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