6 results
Fabrication of Nanostructures of Low-Resistivity Silicon Wafer with High-Aspect-Ratio Using Carbon Nanotube Probe of Scanning Tunneling Microscope
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1527 / 2013
- Published online by Cambridge University Press:
- 20 March 2013, mrsf12-1527-uu06-13
- Print publication:
- 2013
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Characterization of nanocrystalline surface layer induced by shot peening and effect on their fatigue strength.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 843 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, T3.7
- Print publication:
- 2004
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Fabrication of High Aspect Ratio Nanoscale Pit Using Carbon Nanotube Probe
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- Journal:
- MRS Online Proceedings Library Archive / Volume 849 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, KK3.8
- Print publication:
- 2004
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Development of In-Situ Surface Observation System with an Atomic Resolution under Tensile Stress by Atomic Force Microscope
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- Journal:
- MRS Online Proceedings Library Archive / Volume 750 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, Y8.5
- Print publication:
- 2002
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Synthesis of B-C-N Thin Films by Ion-Beam-Assisted Deposition and Their Mechanical Properties
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- Journal:
- MRS Online Proceedings Library Archive / Volume 647 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, O11.5
- Print publication:
- 2000
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Effect of Substrate Materials on Mechanical Properties and Microstructure of Carbon Nitride Films Prepared by Ion-beam-assisted deposition
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- Journal:
- MRS Online Proceedings Library Archive / Volume 647 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, O11.8
- Print publication:
- 2000
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