3 results
Measuring the minority carrier diffusion length in n-GaN using bulk STEM EBIC
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1842-1843
- Print publication:
- August 2018
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Liquid-Cell TEM Observations of Sn Lithiation reactions: A Temperature Case Study
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1966-1967
- Print publication:
- July 2017
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Imaging of Electric Fields at the GaN/Ni Interface Using Electron Beam Induced Current in a Scanning Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1430-1431
- Print publication:
- July 2017
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