7 results
Effective Utilization of STEM Imaging Capability in FIB for Physical Failure Analysis on 20nm & 14nm Transistor Nodes in Semiconductor Wafer Foundries
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 902-903
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- August 2013
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Automated TEM Sample Preparation from Smaller Device Structure Regions of Semiconductor ICs using Inline Dual-Beam CLM+ and TEMLink 150
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 900-901
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- August 2013
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An Effective Approach to Extract Cross-Sectional Information from Top-Down SEM for 20nm & 14nm Transistor Nodes in Semiconductor Wafer-Foundries
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1122-1123
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- August 2013
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Excellent buffer layer for growing high-quality Y–Ba–Cu–O thin films
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- Journal:
- Journal of Materials Research / Volume 16 / Issue 10 / October 2001
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2864-2868
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- October 2001
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Deposition of crystal polythiophene thin films by KrF excimer laser ablation
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- Journal:
- Journal of Materials Research / Volume 15 / Issue 2 / February 2000
- Published online by Cambridge University Press:
- 31 January 2011, pp. 536-540
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- February 2000
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Investigation On Laser-Induced Effects In Nanostructure Fabrication With Laser-Irradiated Scanning Tunneling Microscope Tips in Air Ambient
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- Journal:
- MRS Online Proceedings Library Archive / Volume 617 / 2000
- Published online by Cambridge University Press:
- 10 February 2011, J3.8
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- 2000
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Effects of Sample Processing and High-Energy Electron Irradiation Conditions on the Structural and Transitional Properties of P(VDF-TrFE) Copolymer Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 600 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 47
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- 1999
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