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Analysis of Electron Traps in a-IGZO Thin Films after High Pressure Vapor Annealing by Capacitance–Voltage Method
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1436 / 2012
- Published online by Cambridge University Press:
- 02 August 2012, mrss12-1436-k05-28
- Print publication:
- 2012
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- Article
- Export citation