5 results
Direct Electron Detection for Atomic-Resolution EELS Mapping at Cryogenic Temperature
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 454-455
- Print publication:
- August 2018
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Enhanced Sensitivity of Atomic-Resolution Spectroscopic Imaging by Direct Electron Detection
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 366-367
- Print publication:
- July 2017
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Impurity Segregation via Extended Defects in Oxide Thin Films Probed by Aberration-Corrected STEM-EELS
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1518-1519
- Print publication:
- July 2016
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Strain Control at Two-Dimensional Oxide Interfaces Probed by Aberration-Corrected STEM-EELS
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1137-1138
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- August 2015
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Magnetic Field Dependence of the Schottky Barrier Height at Manganite/Titanate Heterointerfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1000 / 2007
- Published online by Cambridge University Press:
- 12 July 2019, 1000-L05-06
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- 2007
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