2 results
Electron Scattering in Buried InGaAs MOSFET Channel with HfO2 Gate Oxide
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1155 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1155-C02-03
- Print publication:
- 2009
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The Electrical Characterization of Molecular-Beam-Deposited LaAlO3 on GaAs and its Annealing Effects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 996 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 0996-H05-31
- Print publication:
- 2007
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- Article
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