6 results
Roughness Analysis of Episurfaces Grown on Ion-Beam Processed GaSb Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 829 / 2004
- Published online by Cambridge University Press:
- 26 February 2011, B6.3
- Print publication:
- 2004
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Tip Shape Deconvolution of InSb / GaSb Ion Beam Assisted Etched Substrates by AFM
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 1242-1243
- Print publication:
- August 2003
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Fabrication of Nanotips and Microbeams in Antimonide Based Semiconductor Material using Bromine Ion Beam Assisted Etching
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- Journal:
- MRS Online Proceedings Library Archive / Volume 792 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, R7.7
- Print publication:
- 2003
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Micromechanical Characterization of Gasb by Microbeam Deflecion and Using Nanoprobe and Finite Element Analysis
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- Journal:
- MRS Online Proceedings Library Archive / Volume 782 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, A5.14
- Print publication:
- 2003
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Nanocharacterization Of Gallium Antimonide Substrate Surface By Tem/Afm
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1258-1259
- Print publication:
- August 2002
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Some Applications of Ion Beams in III-V Compound Semiconductor Device Fabrication
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- Journal:
- MRS Online Proceedings Library Archive / Volume 144 / 1988
- Published online by Cambridge University Press:
- 26 February 2011, 421
- Print publication:
- 1988
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