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Multivariate Statistical Analysis of Time of Flight Secondary Ion Mass Spectrometry Raw Data Files
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1356-1357
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- August 2007
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Exploration of a Butterfly Wing Using a Diverse Suite of Characterization Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1228-1229
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- August 2006
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Applications of ToF-SIMS in a Research and Development Laboratory
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1226-1227
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- August 2006
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Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Spectral Images - Unbiased Analysis of the Entire 3-Dimensional Data Cube
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 442-443
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- August 2005
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Fluoroalkyl Iodide Photodecomposition on Diamond (100) - an Efficient Route to The Fluorination of Diamond Surfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 416 / 1995
- Published online by Cambridge University Press:
- 10 February 2011, 293
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- 1995
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