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Advanced microelectromechanical systems-based nanomechanical testing: Beyond stress and strain measurements
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- Journal:
- MRS Bulletin / Volume 44 / Issue 6 / June 2019
- Published online by Cambridge University Press:
- 11 June 2019, pp. 487-493
- Print publication:
- June 2019
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On-chip tensile testing of nanoscale silicon free-standing beams
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- Journal:
- Journal of Materials Research / Volume 27 / Issue 3 / 14 February 2012
- Published online by Cambridge University Press:
- 04 November 2011, pp. 571-579
- Print publication:
- 14 February 2012
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Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 6 / December 2011
- Published online by Cambridge University Press:
- 27 October 2011, pp. 983-990
- Print publication:
- December 2011
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