6 results
An Autonomous Microscopy Workflow for Structure Determination from Atomic-Resolution Images
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 510-511
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- August 2018
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Atomistic Study of Model CdTe Grain Boundaries
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1398-1399
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- July 2016
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Atomic Scale Study of Lomer-Cottrell and Hirth Lock Dislocations in CdTe
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2087-2088
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- August 2015
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Characterization of Poly-Crystalline CdTe Solar Cells Using Aberration-Corrected Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 522-523
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- August 2014
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Chemical Analysis with Single Atom Sensitivity Using Aberration-Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 56-57
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- August 2014
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A New Silicon Drift Detector for High Spatial Resolution STEM-XEDS: Performance and Applications
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 4 / August 2014
- Published online by Cambridge University Press:
- 29 July 2014, pp. 1046-1052
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- August 2014
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