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Atomistic Study of Model CdTe Grain Boundaries

Published online by Cambridge University Press:  25 July 2016

Tadas Paulauskas ,
Fatih Sen ,
Cyrus Sun ,
Edward Barnard ,
Moon Kim ,
Sivananthan Sivalingham ,
Maria Chan  and
Robert Klie
Tadas Paulauskas
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL
Fatih Sen
Affiliation:
University of Texas at Dallas, Department of Materials Science and Engineering, Dallas, TX
Cyrus Sun
Affiliation:
Argonne National Laboratory, Center for Nanoscale Materials, Argonne, IL
Edward Barnard
Affiliation:
Lawrence Berkeley National Laboratory, Molecular Foundry, Berkeley, CA
Moon Kim
Affiliation:
Argonne National Laboratory, Center for Nanoscale Materials, Argonne, IL
Sivananthan Sivalingham
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL
Maria Chan
Affiliation:
University of Texas at Dallas, Department of Materials Science and Engineering, Dallas, TX
Robert Klie
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1398 - 1399
Copyright
© Microscopy Society of America 2016 

References

[1] NREL. Best Research-Cell Efficiencies. 2016; Available from: http://www.nrel.gov/ncpv/images/efficiency_chart.jpg.Google Scholar
[2] Shockley, W. & Queisser, H.J. Detailed Balance Limit of Efficiency of p-n Junction.Google Scholar
[3] Paulauskas, T., et al, Applied Physics Letters, (2014).Google Scholar
[4] We acknowledge funding from the DoE Sunshot program under contract # DOE DEEE005956.Google Scholar