6 results
Overview of Nanoscale Energetic Materials Research at Los Alamos
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- Journal:
- MRS Online Proceedings Library Archive / Volume 896 / 2005
- Published online by Cambridge University Press:
- 26 February 2011, 0896-H03-03
- Print publication:
- 2005
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High Precision Measurement of Obsidian Hydration Layers on Artifacts from the Hopewell Site Using Secondary Ion Mass Spectrometry
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- Journal:
- American Antiquity / Volume 69 / Issue 3 / July 2004
- Published online by Cambridge University Press:
- 20 January 2017, pp. 555-567
- Print publication:
- July 2004
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Xafs as a Direct Local Structural Probe in Revealing the Effects of C Presence in B Diffusion in Sige Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 810 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, C11.10
- Print publication:
- 2004
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Non-routine Dopant, Impurity and Stoichiometry Characterization of SiGe, SiON and Ultra-low Energy B-implanted Si Using Secondary Ion Mass Spectrometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 717 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, C6.1/B9.1
- Print publication:
- 2002
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The Local Structure of Antimony in High Dose Antimony Implants in Silicon by XAFS and SIMS.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 717 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, C3.6
- Print publication:
- 2002
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Boron Diffusion in Polycrystalline Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 76 / 1986
- Published online by Cambridge University Press:
- 25 February 2011, 283
- Print publication:
- 1986
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