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The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 2 / April 2010
- Published online by Cambridge University Press:
- 26 February 2010, pp. 183-193
- Print publication:
- April 2010
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Early Results from an Aberration-Corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 6 / December 2006
- Published online by Cambridge University Press:
- 11 October 2006, pp. 483-491
- Print publication:
- December 2006
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