3 results
An In Situ SEM-FIB-Based Method for Contrast Enhancement and Tomographic Reconstruction for Structural Quantification of Porous Carbon Electrodes
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 5 / October 2014
- Published online by Cambridge University Press:
- 04 August 2014, pp. 1576-1580
- Print publication:
- October 2014
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Correlative Microscopy Using TEM and SIMS: Parallel Ion Electron Spectrometry (PIES) for High-Resolution, High-Sensitivity Elemental Mapping for Applications in Materials Science and Biology
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 970-971
- Print publication:
- August 2014
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In situ break-junction sample holder for transmission electron microscopy
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- Journal:
- The European Physical Journal - Applied Physics / Volume 64 / Issue 3 / December 2013
- Published online by Cambridge University Press:
- 09 December 2013, 31001
- Print publication:
- December 2013
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