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Grafting the FIB Lift-out TEM Sample for Further Ion Milling
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1168-1169
- Print publication:
- August 2004
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STEM Scanning Mode Observation of Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 22 July 2003, pp. 486-487
- Print publication:
- August 2003
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- Article
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