4 results
TEM Examination on the Microstructure Rearrangement of ECRPVECD Nc-Si Thin Films Caused By Low Temperature Annealing
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 844-845
- Print publication:
- August 1999
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Surface Conditioning Issues Related to Patiterning and Etching
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- Journal:
- MRS Online Proceedings Library Archive / Volume 259 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 55
- Print publication:
- 1992
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Electronic Device Fabrication Using Electron Cyclotron Resonance Etching of Boron Doped Homoepitaxial Diamond Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 242 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 145
- Print publication:
- 1992
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Electron Transport Mechanisms in Nickel Schottky Barrier Contacts to Hydrogenated Amorphous Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 258 / 1992
- Published online by Cambridge University Press:
- 21 February 2011, 1031
- Print publication:
- 1992
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