12 results
Structural Characterization of Beam Sensitive Pharmaceutical Compounds Using 3D Electron Diffraction-Micro-ED at Low Dose with Pixelated Detectors
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, p. 1522
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- August 2020
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Electron Crystallography in the Age of Pixelated Detectors: From Crystalline/Amorphous Organic Structural Models and Phase Mapping of Beam Sensitive Materials
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1948-1949
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- August 2019
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Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1066-1067
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- August 2014
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Ultra-fast TEM electron diffraction tomography
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 700-701
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- August 2013
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Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 702-703
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- August 2013
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Nanoscale Automated Phase and Orientation Mapping in the TEM
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- Journal:
- Microscopy Today / Volume 20 / Issue 6 / November 2012
- Published online by Cambridge University Press:
- 02 November 2012, pp. 38-42
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- November 2012
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Automated Crystal Orientation and Phase Mapping for Thin Film Applications by Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1086-1087
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- July 2011
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Automated Crystallite Orientation & Phase Mapping in the TEM: Diffraction Contrast in Virtual Bright/Dark Field Images of Polycrystalline Copper
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1098-1099
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- July 2011
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Novel Applications of Zeiss Libra 200 Cs-Corrected TEM with Energy Filtered Precession Electron Diffraction for Structure Determination of Nanocrystals
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 26-27
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- July 2010
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Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1230-1231
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- July 2009
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High Throughput Automated Crystal Orientation and Phase Mapping of Nanoparticles from HREM - TEM Images
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 756-757
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- July 2009
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Automated Crystal Orientation and Phase Mapping of Iron Oxide Nano-Crystals in a Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1290-1291
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- July 2009
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