7 results
Determination of Thickness and Composition of Thin AlxGa1-xAs Films on GaAs substrates by Total Electron Yield (Tey) Measurements
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
- Published online by Cambridge University Press:
- 06 March 2019, pp. 683-694
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- 1995
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Depth profiling by Xrf with Variable Beam Geometry Applied to Thin Films in the Nanometer Region
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
- Published online by Cambridge University Press:
- 06 March 2019, pp. 675-682
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- 1995
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On the Sampling Depth of Total Electron Yield (Tey) Measurements
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
- Published online by Cambridge University Press:
- 06 March 2019, pp. 665-674
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- 1995
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Total Electron Yield (TEY) A New Approach for Quantitative X-ray Analysis
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- Journal:
- Advances in X-ray Analysis / Volume 38 / 1994
- Published online by Cambridge University Press:
- 06 March 2019, pp. 325-335
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- 1994
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Determination of Thickness and Composition of Thin AlxGa1-xAs Layers on GaAs by Total Electron Yield (TEY)
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- Journal:
- Advances in X-ray Analysis / Volume 38 / 1994
- Published online by Cambridge University Press:
- 06 March 2019, pp. 127-137
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- 1994
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Xrf With Tunable Monochromatic Excitation and Variation of the Incidence Angle
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- Journal:
- Advances in X-ray Analysis / Volume 37 / 1993
- Published online by Cambridge University Press:
- 06 March 2019, pp. 619-627
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- 1993
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Angle Dependent XRF for the Analysis of Thin Al(x)Ga(1-x)As Layers on GaAs and Thin Zn Layers on Steel
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- Journal:
- Advances in X-ray Analysis / Volume 36 / 1992
- Published online by Cambridge University Press:
- 06 March 2019, pp. 263-271
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- 1992
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