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Off-axis Electron Holography on 2D Materials with Small Coherent and Incoherent Aberrations
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 128-129
- Print publication:
- August 2021
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Thick (3D) Sample Imaging Using iDPC-STEM at Atomic Scale
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 170-171
- Print publication:
- August 2018
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New Workflows Broaden Access to S/TEM Analysis and Increase Productivity
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- Journal:
- Microscopy Today / Volume 26 / Issue 1 / January 2018
- Published online by Cambridge University Press:
- 05 January 2018, pp. 18-25
- Print publication:
- January 2018
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