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Towards Non-Destructive Burgers Vector Identification of Dislocations in Electronic Materials via Electron Channeling Contrast Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1558-1559
- Print publication:
- July 2010
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- Article
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Future Prospects for SEM-based Defect Analysis using Fast Electrons
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 608-609
- Print publication:
- July 2010
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- Article
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- You have access
- Export citation