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Automated TEM Sample Preparation from Smaller Device Structure Regions of Semiconductor ICs using Inline Dual-Beam CLM+ and TEMLink 150
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 900-901
- Print publication:
- August 2013
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Surface Damage During Kev Ion Irradiation: Results of Computer Simulations
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- Journal:
- MRS Online Proceedings Library Archive / Volume 388 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 337
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- 1995
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Surface Effects During Ion Beam Processing of Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 396 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 3
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- 1995
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Defect Production Mechanisms During keV Ion Irradiation: Results of Computer Simulations
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- Journal:
- MRS Online Proceedings Library Archive / Volume 373 / 1994
- Published online by Cambridge University Press:
- 16 February 2011, 3
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- 1994
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Coherency Strain Energy in any Crystal System: Applications to in Situ Observations of Cigm in Calcite
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- Journal:
- MRS Online Proceedings Library Archive / Volume 205 / 1990
- Published online by Cambridge University Press:
- 26 February 2011, 245
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- 1990
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