2 results
Study of Back-Channel Defect States on Bottom-Gate IGZO TFTs Using Capacitance-Voltage Analysis
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1731 / 2015
- Published online by Cambridge University Press:
- 23 February 2015, mrsf14-1731-o08-03
- Print publication:
- 2015
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- Article
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Passivation and Annealing for Improved Stability of High Performance IGZO TFTs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1692 / 2014
- Published online by Cambridge University Press:
- 14 October 2014, mrss14-1692-cc12-02
- Print publication:
- 2014
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- Article
- Export citation