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Characterization Of Single Crystal Epitaxial Aluminum Nitride Thin Films On Sapphire, Silicon Carbide And Silicon Substrates By X-Ray Double Crystal Diffractometry And Transmission Electron Microscopy
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
- Published online by Cambridge University Press:
- 06 March 2019, pp. 645-651
- Print publication:
- 1995
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- Article
- Export citation