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Shall We Still Consider HRTEM Image Simulation to Interpret Micrographs Obtained Using Cs (and Cc) Corrected Electron Microscopes?
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 582-583
- Print publication:
- August 2013
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Wedge Tem Characterization of Movpe GaInAs/InP Layers, Concentration Grading at Interfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 198 / 1990
- Published online by Cambridge University Press:
- 28 February 2011, 135
- Print publication:
- 1990
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High Resolution Observation and Image Simulation on Cleaved Wedges of III–V Semiconductors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 139 / 1989
- Published online by Cambridge University Press:
- 21 February 2011, 111
- Print publication:
- 1989
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