4 results
SEM/EDS Trace Analysis: Limits Imposed by Fluorescence of the Detector
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1026-1027
- Print publication:
- July 2017
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Standard Bundles Simplify Standards-based Quantification in NIST DTSA-II
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 220-221
- Print publication:
- July 2017
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Overcoming Peak Overlaps in Titanium- and Vanadium-Bearing Materials with Multiple Linear Least Squares Fitting
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 3 / June 2017
- Published online by Cambridge University Press:
- 10 March 2017, pp. 491-500
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- June 2017
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Use of a Laser Engraver in Relocations and Sample Preparation for SEM and Light Microscope Analysis.
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 456-457
- Print publication:
- July 2016
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