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Analysis of Fluorine Traces in TiO2 Nanoplatelets by SEM/EDX, AES and TOF-SIMS
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1908-1909
- Print publication:
- July 2017
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What about Ionic Liquids as a “hot” Certified Reference Material Candidate to check Your EDS below 1 keV?
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1715-1716
- Print publication:
- August 2015
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