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Analysis of Fluorine Traces in TiO2 Nanoplatelets by SEM/EDX, AES and TOF-SIMS

Published online by Cambridge University Press:  04 August 2017

Steffi Rades ,
Erik Ortel ,
Thomas Wirth ,
Markus Holzweber ,
Francesco Pellegrino ,
Gianmario Martra  and
Vasile-Dan Hodoroaba
Steffi Rades
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Division Surface Analysis and Interfacial Chemistry, Berlin, Germany
Erik Ortel
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Division Surface Analysis and Interfacial Chemistry, Berlin, Germany
Thomas Wirth
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Division Surface Analysis and Interfacial Chemistry, Berlin, Germany
Markus Holzweber
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Division Surface Analysis and Interfacial Chemistry, Berlin, Germany
Francesco Pellegrino
Affiliation:
University of Torino, Department of Chemistry, Torino, Italy.
Gianmario Martra
Affiliation:
University of Torino, Department of Chemistry, Torino, Italy.
Vasile-Dan Hodoroaba
Affiliation:
Federal Institute for Materials Research and Testing (BAM), Division Surface Analysis and Interfacial Chemistry, Berlin, Germany

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1908 - 1909
Copyright
© Microscopy Society of America 2017 

References

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[3] Ortel, E, et al, Microsc. Microanal 2015 21(Suppl 3p. 2401.CrossRefGoogle Scholar
[4] Ortel, E, et al, Surf. Interface Anal 48 2016). p. 664.Google Scholar
[5] Hodoroaba, V-D, et al, IOP Conf. Series: Materials Science and Engineering 109 2016). p. 012006.Google Scholar
[6] Rades, S, et al, RSC Adv 4 2014). p. 49577.Google Scholar
[7] This project has received funding from the European Union's Seventh Framework Programme under grant agreement no. 604577 (SETNanoMetro).Google Scholar