4 results
TEM Characterization of Epitaxial MnSi Films Grown on (111) Si Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1228-1229
- Print publication:
- July 2010
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Compositional Analysis in InAs/InGaAlAs/InP Quantum Wire Structures with Electron Energy Loss Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1270-1271
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- August 2007
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Annular Dark Field Image Contrast of Strained GaNyAs1-y Epitaxial Layers on GaAs
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 830-831
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- August 2007
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The Simulation of Annular Dark Field Images of InAs/InP Quantum Dots
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 714-715
- Print publication:
- August 2006
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