2 results
Enhancing Contrast of Al Traces on Si Substrates using Low-voltage SEM-hosted XRM
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1118-1119
- Print publication:
- August 2008
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Characterization and Tomography of Nanoscale Domain Structures in Ferroelectric and Multiferroic Layered Oxides
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 826-827
- Print publication:
- August 2007
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