4 results
Characterization of 3D Dopant Distribution in State of the Art FinFET Structures
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 960-961
- Print publication:
- August 2013
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Impurity Measurments in Polycrystallline Material with Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 276-277
- Print publication:
- July 2009
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New Measurements of Deconvoluted EDS Spectra of Elemental Standards as a Function of Atomic Number and Electron Beam Energy
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 830-831
- Print publication:
- August 2006
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Electron Probe Microanalysis of Cr Films on Semiconducting and Insulating Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1308-1309
- Print publication:
- August 2005
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