3 results
A TEM Structural Study of the Origin of Perpendicular Magnetic Anisotropy in Ultra-thin CoFeB Film
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1696-1697
- Print publication:
- July 2016
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A New Method to Characterize Non-oxide Thin Film Uniformity at Device Level using Electron Energy Loss Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 293-294
- Print publication:
- August 2015
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Materials Selection for Ultra-Thin Diamond-Like Carbon Film Metrology and Structural Characterization by TEM
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 827-828
- Print publication:
- August 2015
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