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High Energy BSE/SE/STEM Imaging of 8 um Thick Semiconductor Interconnects
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 8-9
- Print publication:
- August 2014
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A Comparison of Grain Size Measurements in Al-Cu Thin Films: Imaging Vs. Diffraction Techniques
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- Journal:
- Microscopy Today / Volume 10 / Issue 6 / November 2002
- Published online by Cambridge University Press:
- 14 March 2018, pp. 5-9
- Print publication:
- November 2002
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A Comparison of Grain Size Measurements in Al-Cu Thin Films: Imaging verses Diffraction Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 672-673
- Print publication:
- August 2002
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