6 results
Estimation of Silicon Nanocrystalline Sizes from Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 737 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, F3.30
- Print publication:
- 2002
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Sensitization of the Holes Lifetime by the Addition of Dangling Bonds in a-Si:H
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- Journal:
- MRS Online Proceedings Library Archive / Volume 664 / 2001
- Published online by Cambridge University Press:
- 17 March 2011, A22.2
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- 2001
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Diffusion Length Measurements of Minority Carriers in Si-SiO2 Using the Photo-Grating Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 638 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, F14.44.1
- Print publication:
- 2000
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Two Carrier Sensitization as a Spectroscopic Tool for a-Si:H
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- Journal:
- MRS Online Proceedings Library Archive / Volume 557 / 1999
- Published online by Cambridge University Press:
- 15 February 2011, 439
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- 1999
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Line Shape in Resonance Raman Scattering from Silicon Quantum Dots
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- Journal:
- MRS Online Proceedings Library Archive / Volume 571 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 235
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- 1999
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Study of the Luminescence of Eu-Doped Nanocrystalline Si/SiO2 Systems Prepared by RF Co-Sputtering
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- Journal:
- MRS Online Proceedings Library Archive / Volume 581 / 1999
- Published online by Cambridge University Press:
- 21 February 2011, 647
- Print publication:
- 1999
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