6 results
Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 650-651
- Print publication:
- July 2016
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Atom Probe Tomography: Beyond the Microscope, a Breakthrough Backdoor for Chemical, Physical and Functional Characterization at the Nanometer Scale
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 984-985
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- August 2013
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“Recovery” Effect of Electron Induced Damage in 4H-SiC Schottky Diodes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 792 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, R10.6
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- 2003
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Commission 46: Teaching of Astronomy
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- Journal:
- Transactions of the International Astronomical Union / Volume 19 / Issue 1 / 1985
- Published online by Cambridge University Press:
- 25 April 2016, pp. 653-654
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- 1985
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46. Teaching of Astronomy
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- Journal:
- Transactions of the International Astronomical Union / Volume 18 / Issue 1 / 1982
- Published online by Cambridge University Press:
- 25 April 2016, pp. 633-634
- Print publication:
- 1982
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46. Teaching of Astronomy (L’Enseignement de l’Astronomie)
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- Journal:
- Transactions of the International Astronomical Union / Volume 16 / Issue 1 / 1976
- Published online by Cambridge University Press:
- 25 April 2016, pp. 207-217
- Print publication:
- 1976
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