26 results
Manipulation of Ceramic Fibers to EXpressLO™ Grids for FIB/TEM Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 134-135
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- July 2016
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FIB Applications: A Historical Perspective
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 294-295
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- August 2014
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Investigation of the Embrittlement of Bi Doped Cu Bicrystals by Aberration-Corrected Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1738-1739
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- August 2013
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Investigation of Grain Boundary Structure and Composition of Bismuth Embrittled Copper Bicrystals with Aberration-Corrected Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 346-347
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- July 2012
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TEM Specimen Preparation with Plasma FIB Xe+ Ions
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 646-647
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- July 2011
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Latest Developments in FIB Technology and Applications
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 166-167
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- July 2010
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FIB/DualBeam Techniques for Quantitative Analyses
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1408-1409
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- August 2007
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Improved EBSD Sample Preparation Via Low Energy Ga+ FIB Ion Milling
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 926-927
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- August 2007
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Evidence for a Critical Amorphization Thickness Limit of Ga+ Ion Bombardment in Si
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1516-1517
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- August 2007
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Computed Tomographic Spectral Imaging: 3D STEM-EDS Spectral Imaging
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1324-1325
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- August 2007
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Static vs. Dynamic FIB/SEM Methods For 3D Modeling
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1506-1507
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- August 2007
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2 keV Ga+ FIB Milling for Reducing Amorphous Damage in Silicon
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 828-829
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- August 2005
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Focused Ion Beam Induced X-Ray Analysis
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1348-1349
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- August 2005
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FIB, SEM, and TEM of Bone/Dental Implant Interfaces
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 998-999
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- August 2005
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Issues Affecting Quantitative Evaluation of Dopant Profiles Using Electron Holography
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 21 July 2003, pp. 776-777
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- August 2003
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FIB Damage in Silicon: Amorphization or Redeposition?
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 November 2002, pp. 50-51
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- August 2002
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TEM Specimen Preparation Techniques and Analysis of Photo-Thermo-Refractive Glasses (PTRG)
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
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- 02 July 2020, pp. 432-433
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- August 2001
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Calibration Method for Elemental Quantification
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 536-537
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- August 2000
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Microstructural Characterization of Automated Specimen Preparation for TEM Analysis
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 528-529
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- August 2000
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Revisiting the FIB TEM Lift-Out Specimen Preparation Technique
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 508-509
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- August 2000
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