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X-ray Topography and TEM Study of Crystal Defect Propagation in Epitaxially Grown AIGaAs Layers on GaAs(001)
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- Journal:
- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 507-517
- Print publication:
- 1990
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- Article
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