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STEM and Elemental Analysis by EDS and EELS for Two-dimensional Atomic Structure Containing Au and Cu
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1776-1777
- Print publication:
- August 2019
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Electron Exit Wave Reconstruction From a Single Defocused Image Using a Gaussian Basis
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 745-746
- Print publication:
- August 2015
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Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 930-931
- Print publication:
- August 2014
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