4 results
Measurement of Residual Stress in Thin Films Using the Optical Microprobe
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- Journal:
- MRS Online Proceedings Library Archive / Volume 505 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 513
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- 1997
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Measurement of Nonuniform Stresses in Semiconductors by the Micro-Raman Method
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- Journal:
- MRS Online Proceedings Library Archive / Volume 505 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 507
- Print publication:
- 1997
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Dislocations In GaN/Sapphire: Their Distribution And Effect On Stress And Optical Properties
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- Journal:
- MRS Online Proceedings Library Archive / Volume 482 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 875
- Print publication:
- 1997
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Finite Element Calculations to Optimize the Design of a Stressor for Strained Induced Quantum Wires and Quantum Dots in GaAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 421 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 119
- Print publication:
- 1996
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