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Effect of annealing temperature on the electrical characteristics of Ti–Zn–Sn–O thin-film transistors fabricated via a solution process
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- Journal:
- Journal of Materials Research / Volume 27 / Issue 17 / 14 September 2012
- Published online by Cambridge University Press:
- 18 May 2012, pp. 2293-2298
- Print publication:
- 14 September 2012
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- Article
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