3 results
Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 878-879
- Print publication:
- July 2016
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Overview of Commercially Available CEOS Hexapole-type Aberration Correctors
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 934-935
- Print publication:
- August 2014
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New Electrostatic Phase Plate for Phase-Contrast Transmission Electron Microscopy and Its Application for Wave-Function Reconstruction
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 6 / December 2010
- Published online by Cambridge University Press:
- 15 October 2010, pp. 785-794
- Print publication:
- December 2010
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