3 results
A Scanning Tunneling Microscopy Study: Si/SiO2 Interface Roughness Induced by Chemical Etching
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 838 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, O4.9
- Print publication:
- 2004
-
- Article
- Export citation
Depth Dependence of Dopant Induced Features on The Si(100)2x1:H Surface and Its Application for Three Dimensional Dopant Profiling
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 699 / 2001
- Published online by Cambridge University Press:
- 17 March 2011, R4.5
- Print publication:
- 2001
-
- Article
- Export citation
Scanning Tunneling Microscopy Observation Of Single Dangling Bonds on the Si(100)2×1:H Surface
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 705 / 2001
- Published online by Cambridge University Press:
- 15 March 2011, Y6.6
- Print publication:
- 2001
-
- Article
- Export citation