8 results
Simultaneous Tracking and Registration in SiC/SiC Serial Section Images
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 570-571
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- August 2018
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Physics-Based Image Reconstruction of SiC Grain Boundaries
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 188-189
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- July 2017
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Library-Based Sparse Interpolation and Super-Resolution of S/TEM Images of Biological and Material Nano-Structures
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1446-1447
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- July 2016
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Model-Based Super-Resolution of SEM Images of Nano-Materials
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 532-533
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- July 2016
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A Dictionary Approach to Electron Backscatter Diffraction Indexing*
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 3 / June 2015
- Published online by Cambridge University Press:
- 09 June 2015, pp. 739-752
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- June 2015
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Model-based Iterative Reconstruction for Low-dose Electron Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 802-803
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- August 2014
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Size Distribution of γ' Precipitates in Ni-Cr-Co-Al-Ti Alloys
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1432-1433
- Print publication:
- August 2002
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