4 results
Nanostructural Characterization of CdTe Thin Film Photovoltaics Using Electron Backscatter Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1352-1353
- Print publication:
- July 2010
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Methods of Evaluating EBSD Sample Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 780-781
- Print publication:
- July 2009
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In-Situ Orientation Imaging of Recrystallization and Grain Growth in OFHC Copper
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 678-679
- Print publication:
- July 2009
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Microstructural Analysis of CdTe Thin Films using EBSD and FIB
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1390-1391
- Print publication:
- July 2009
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