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Synchrotron X-ray Micro Tomography at the Advanced Light Source: In-Situ Sample Environments for Advanced Aerospace Materials
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 444-445
- Print publication:
- August 2018
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Interference-enhanced Raman Scattering in Strain Characterization of Ultra-thin Strained SiGe and Si Films on Insulator
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- Journal:
- MRS Online Proceedings Library Archive / Volume 809 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, B3.6
- Print publication:
- 2004
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Relaxed SiGe Layers with High Ge Content by Compliant Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 768 / 2003
- Published online by Cambridge University Press:
- 02 August 2011, G1.7/D4.7
- Print publication:
- 2003
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Relaxed SiGe Layers with High Ge Content by Compliant Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 765 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, D4.7/G1.7
- Print publication:
- 2003
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High-Level Waste Package Licensing Considerations for Extrapolating test Data
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- Journal:
- MRS Online Proceedings Library Archive / Volume 84 / 1986
- Published online by Cambridge University Press:
- 28 February 2011, 3
- Print publication:
- 1986
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