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Contributors
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- Book:
- Monitoring in Anesthesia and Perioperative Care
- Published online:
- 05 July 2011
- Print publication:
- 08 August 2011, pp vii-ix
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Analysis Of Sige Fet Device Structures On Silicon-on-sapphire Substrates by X-Ray Diffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 533 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 55
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- 1998
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High Resolution X-ray Diffraction Measurements of Strain Relaxed SiGe/Si Structures
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- Journal:
- Advances in X-ray Analysis / Volume 38 / 1994
- Published online by Cambridge University Press:
- 06 March 2019, pp. 181-193
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- 1994
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High-Resolution X-Ray Diffraction Measurements of SiGe/Si Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 375 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 201
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- 1994
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Electrophoretic Deposition of High-Temperature Superconductor Thick Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 169 / 1989
- Published online by Cambridge University Press:
- 28 February 2011, 759
- Print publication:
- 1989
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