6 results
Concentrated Ar Ion Milling for Aberration - Corrected Electron Microscopy: A Review
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 632-633
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- July 2011
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Preparation of Materials for EBSD using an Adjustable Broad Beam Ion Source
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 390-391
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- July 2011
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Raising the Standard of Specimen Preparation for Aberration-Corrected TEM and STEM
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- Journal:
- Microscopy Today / Volume 19 / Issue 1 / January 2011
- Published online by Cambridge University Press:
- 11 January 2011, pp. 16-19
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- January 2011
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Nanomilling for Aberration – Corrected TEM and HAADF STEM
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 348-349
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- July 2009
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Automated Sample Preparation of Low-k Dielectrics for FESEM
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2108-2109
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- August 2005
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In-Plane Magnetic Field Lorentz Stage for Use in a TEM/STEM
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 522-523
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- August 2004
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