3 results
TEM Study on PbS Quantum Dots Made by Atomic Layer Deposition and Their Behavior Under E-beam Irradiation
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1376-1377
- Print publication:
- July 2010
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In Situ and High Resolution TEM Studies of Nano-scale Materials
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1200-1201
- Print publication:
- July 2009
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Dislocation Analysis of Semiconductor Devices using 3D Rotation Imaging Technique of Dedicated STEM
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 338-339
- Print publication:
- July 2009
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